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However, if this performance test failed, it could be very difficult to resolve which capacitor was missing One non-traditional way to test for this problem is to use human visual inspection to look for missing capacitors This may not find solder opens, however Another approach would be to use an automated x-ray laminographic tester to check for the existence and solder integrity of each capacitor Even the orientation of polarized capacitors can be verified (See Chap 53 for a discussion of x-ray inspection) Second, consider again the open solder problem on a digital device input This defect may manifest itself as improper device behavior, but it would be wrong to replace the device (which would also fix the solder open) because the device is not at fault Digital in-circuit testing has trouble resolving solder opens on input pins from bad devices.

* Final resolution can be obtained either by visual inspection or by using a handheld probe to see if board signals reach IC legs, but this is becoming increasingly difficult as packaging dimensions continue to shrink (eg, TAB) and newer attachment technologies (eg, ball grid arrays) are used that prohibit visual inspection or probing altogether An alternative approach to the open solder problem uses a capacitive coupling technique to look for opens The technique exploits the fact that many ICs have a leadframe that forms the conductive path from the legs of the device to the die bond wire pads Using the bed of nails, all but one node attached to the IC can be grounded (this is an unpowered technique) and a small AC signal can be applied to the node that remains.

Asking questions is a skill that attorneys and talk show hosts master as part of their jobs. You may not have your own show, but your ability to ask well-prepared questions can bene t you throughout your career. Informational interviewing is an excellent way to get rsthand information, but some hazards are associated with interviews: The person may not tell you the truth or might not show up. Or you may think the information the person tells you applies to a larger population when, in reality, it is simply the opinion of one person. As long as you keep these limitations in mind, interviewing can be fun and very rewarding. If you are a college student, you will nd that, in general, people are more willing to talk with you now than at any other time in your life unless you become rich and famous. If you choose to interview someone in person, online, or by phone, follow these simple rules:

An insulated metal plate pressed against the top of the IC forms the top plate of a capacitor and the stimulated IC leg and lead frame conductor form the bottom plate..

* Ignore for the moment the possibility of using boundary scan to solve this problem, which is discussed in Chap. 54.

Figure 55.13 shows an equivalent circuit for capacitive opens test for a properly soldered IC lead and for an open solder condition. The capacitance C1 may be on the order of 100 fF (100 10 15 F), which is small enough to require sophisticated detection electronics to measure in the face of environmental noise. Now, if the IC leg is soldered to the stimulated board node, the correct capacitance will be measured. If the solder joint is open, then a second small capacitance C2 now exists in series with the first. This reduces the measured capacitance by a factor of 2 to 10. Capacitive leadframe test allows testing of complex ICs for solder opens without knowing what the ICs actually do and without applying power. The technique requires no complicated programming, and gives accurate resolution of solder defects. The technique has been extended to allow testing of solder integrity for connectors and switches. A fixture for capacitive leadframe testing is shown Fig. 55.14.

FIGURE 55.14 A test fixture with board on a bed of nails, with clamshell top fixture containing capacitive sensor plates. Notice eight closely spaced sensor plates (right) that test for opens in eight (white) connectors on the board.

We can obtain the equations in the present case by setting 0 and f . So for Rrr , we have Rrr = 2 df r dr (12.3)

Table 55.2 summarizes the types of tester for comparative costs and capabilities. A majority of manufacturers value good diagnostic resolution and fault coverage, so it is not surprising that in-circuit and combinational testers are in widespread use. Next in prevalence are the MDA testers, which are typically used where coverage and diagnostic resolution may be sacrificed

TABLE 55.2 Costs and Capabilities of Various Testers Typical cost ($) 10 10

Comments No digital coverage; requires known good board for programming. Fixturing is a major portion of preparation time. Functional test programming is a major portion of preparation time. Very high skill required for test preparation and interpreting results. Very high skill required for test preparation and interpreting results.

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